Courses

31822 - ECE 774 Semiconductor Characterization

Introduction of basic methods for semiconductor material and device characterization. Topics include resistivity, carrier doping concentration, contact resistance, Schottky barrier height, series resistance, channel length, threshold voltage, mobility, oxide and interface trapped charge, deep level impurities, carrier lifetime, and optical, chemical and physical characterization

Total Credit Hours: 3
Semester(s):
Spring 2021
Prerequisites:
ECE 473 or ECE 573 or equivalent.
Instructor:
Baumgart, Helmut
Instructor Email:
HBAUMGAR@ODU.EDU

Weekly Live Sessions

Mon Tue Wed Thu Fri Sat

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Questions? Contact the ODU CGEP Director:

Anothony W. Dean   •   Ph: 757-683-7121   •   adean@odu.edu